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Fundamental Principles of DRAM
Jul 4, 2024
Fundamental Principles of DRAM
DRAM Memory Cell
Basic Unit
: Capable of storing a single binary digit (0 or 1).
Components
:
Transistor
: Acts as a switch with gate, source, and drain.
Capacitor
: Stores electric charge; connected to the transistor's drain and to ground.
Ground
: Reference voltage; often considered as 0 volts.
Transistor Operation
Voltage at Source
: Blocks current flow.
Applied Voltage at Gate
: Allows current to flow from source to drain.
Closed Gate
: Blocks current flow; capacitor remains charged if previously charged.
Pass Transistor
: Refers to transistor in a memory cell that manages charge/discharge of capacitor.
Charging and Discharging
Charge State
: Represents a binary 1.
Gate open → Current charges capacitor in nanoseconds.
Gate closed → Capacitor stays charged.
Discharge State
: Represents a binary 0.
Gate open (source voltage absent) → Capacitor discharges.
Array Organization
2D Arrangement
: DRAM cells connected via word lines and bit lines.
Sense Amplifiers
:
Connected to bit lines; detects voltage differences to read cells.
Divides DRAM array into sections (Open Bit Line Layout).
Uses differential sensing by comparing bit line voltages.
Reading Process
Row Precharging
: Bit lines precharged to half of DRAM supply voltage (e.g., 1.5V if supply is 3V).
Reading a Cell
:
Word line asserted → Pass transistors open.
Charged capacitor discharges slightly; changes bit line voltage by a small amount.
Sense amplifiers detect these changes and latch values.
Destructive Read
: Cells partially discharge, requiring rewrites immediately after reading.
Write Back
: Sense amplifiers restore original cell values by adjusting bit line voltages.
Refreshing Cells
Charge Leakage
: Cells naturally leak charge over time.
Periodic Refresh
: Every cell read/re-written approximately every 64 nanoseconds.
Summary
DRAM Cell
: Consists of a transistor and capacitor, storing a single binary digit.
Arrangement
: Cells in a rectangular array, connected by word lines and bit lines.
Destructive Read and Refresh
: Every read operation is destructive, requiring immediate rewrites; periodic refresh due to charge leakage.
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