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Sequential Circuit Testing Tutorial

Jul 1, 2024

Sequential Circuit Testing Tutorial

Key Topics

  • Testing sequential circuits
  • Controllability and observability
  • Scan cell design

Testing Internal Nodes

  • Primary Inputs: Directly available inputs
    • Example: Inputs to an AND gate
  • Internal Gates: Inputs not directly connected to primary inputs
    • Lacks controllability and observability
  • Scan Cell Design: Used for testing internal gates

Scan Cell Structure

  • Scan Cell Components: D flip flop, MUX
  • Modes of Operation:
    1. Normal mode: Operates as usual
    2. Test mode: Tests the circuit

Components Explained

  • MUX: Selects between normal input and scan input
  • D Flip Flop: Stores the output
  • Scan Enable Signal: Determines mode (test or normal)

Functioning of Scan Cells

  • Cascade Connection: Scan cells connected in series
  • Scan Mode:
    • Set Scan Enable to 1
    • Inputs shift across flip-flops on clock cycles
  • Normal Mode:
    • Set Scan Enable to 0
    • Circuit operates normally, captures results in flip-flops

Example Process

  1. Scan Mode:
    • Apply scan inputs (e.g., 1, 0, 1)
    • Shift inputs through flip-flops
  2. Normal Mode:
    • Set Scan Enable to 0
    • Apply primary inputs
    • Capture outputs in scan cells
  3. Shift Out Results:
    • Apply clock with Scan Enable set to 1
    • Shift captured outputs to scan out

Testing Process

  • Use scan cells to control and observe internal gate outputs
  • Apply clock cycles to shift inputs and capture outputs
  • Verify whether outputs match expected results

Simulation Results

  • Example sequence of scan inputs and clock cycles
  • Verify whether internal gates produce correct results
  • Identify faults

Conversion to Scan Cell Design

  • Replace D flip flops with scan cells
  • Ensure proper functionality in both modes (shift register for test, normal circuit otherwise)

Practical Tips

  • Identify flip flop locations
  • Ensure cascade connection is correct
  • Test output using scan output (S0)

Conclusion

  • Scan cell design crucial for testing hardware faults
  • Effective for controlling and observing internal nodes
  • For more detailed tutorials and Verilog code: verilogcode.blogspot.team