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Sequential Circuit Testing Tutorial
Jul 1, 2024
Sequential Circuit Testing Tutorial
Key Topics
Testing sequential circuits
Controllability and observability
Scan cell design
Testing Internal Nodes
Primary Inputs
: Directly available inputs
Example: Inputs to an AND gate
Internal Gates
: Inputs not directly connected to primary inputs
Lacks controllability and observability
Scan Cell Design
: Used for testing internal gates
Scan Cell Structure
Scan Cell Components
: D flip flop, MUX
Modes of Operation
:
Normal mode
: Operates as usual
Test mode
: Tests the circuit
Components Explained
MUX
: Selects between normal input and scan input
D Flip Flop
: Stores the output
Scan Enable Signal
: Determines mode (test or normal)
Functioning of Scan Cells
Cascade Connection
: Scan cells connected in series
Scan Mode
:
Set Scan Enable to 1
Inputs shift across flip-flops on clock cycles
Normal Mode
:
Set Scan Enable to 0
Circuit operates normally, captures results in flip-flops
Example Process
Scan Mode
:
Apply scan inputs (e.g., 1, 0, 1)
Shift inputs through flip-flops
Normal Mode
:
Set Scan Enable to 0
Apply primary inputs
Capture outputs in scan cells
Shift Out Results
:
Apply clock with Scan Enable set to 1
Shift captured outputs to scan out
Testing Process
Use scan cells to control and observe internal gate outputs
Apply clock cycles to shift inputs and capture outputs
Verify whether outputs match expected results
Simulation Results
Example sequence of scan inputs and clock cycles
Verify whether internal gates produce correct results
Identify faults
Conversion to Scan Cell Design
Replace D flip flops with scan cells
Ensure proper functionality in both modes (shift register for test, normal circuit otherwise)
Practical Tips
Identify flip flop locations
Ensure cascade connection is correct
Test output using scan output (S0)
Conclusion
Scan cell design crucial for testing hardware faults
Effective for controlling and observing internal nodes
For more detailed tutorials and Verilog code: verilogcode.blogspot.team
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